Description of Research Area

Development of Spectroscopic Imaging of Charge Fluctuations: Exploration of Spatial Fluctuation Patterns in Solids

Research Subject

Charge fluctuations are usually regarded as an obstacle to precise measurements in solid-state devices. In some instances, however, fluctuation measurements provide a direct probe for gaining a deeper understanding of phase transitions of materials. This research project is aimed at developing a novel type of charge fluctuation imaging by integrating a cantilever with a single-electron transistor or quantum point contact, which will lead to high-resolution, ultra-sensitive observations. This measurement system is expected to enable us to obtain direct information about charge fluctuations simultaneously in the space and frequency domains. We plan to apply this 'fluctuation spectroscopic imaging' to solid-state devices and to investigate microscopic mechanisms behind charge distribution and dynamics relevant to the fluctuations.